发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2007 IEEE Radio Frequency Integrated Circuits Symposium - Honolulu, HI, USA (2007.06.3-2007.06.5)] 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Experimental Study on the Role of Hot Carrier Induced Damage on High frequency Noise in Deep Submicron NMOSFETs

[IEEE 2007 IEEE Radio Frequency Integrated Circuits Symposium - Honolulu, HI, USA (2007.06.3-2007.06.5)] 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Experimental Study on the Role of Hot Carrier Induced Damage on High frequency Noise in Deep Submicron NMOSFETs

Su, Hao; Wang, Hong; Xu, Tao; Zeng, Rong

作者Su, Hao; Wang, Hong; Xu, Tao; Zeng, Rong
文件大小320.89KB
发表时间2007
DOI10.1109/rfic.2007.380856
页码163-166

← 返回【学霸图书馆】主页