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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Unified Perspective of NBTI and Hot-Carrier Degradation in CMOS using on-the-Fly Bias Patterns

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Unified Perspective of NBTI and Hot-Carrier Degradation in CMOS using on-the-Fly Bias Patterns

Parthasarathy, CR; Denais, M; Huard, V.; Guerin, C.; Ribes, G.; Vincent, E.; Bravaix, A.
  • 作者Parthasarathy, CR; Denais, M; Huard, V.; Guerin, C.; Ribes, G.; Vincent, E.; Bravaix, A.
  • 文件大小311.46KB
  • 发表时间2007
  • DOI10.1109/relphy.2007.369575
  • 页码696-697
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