[IEEE 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - Warsaw, Poland (2007.05.1-2007.05.3)] 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 - System Identification Approach Applied to Drift Estimation
Verbeyst, Frans; Pintelon, Rik; Rolain, Yves; Schoukens, Johan; Clement, Tracy S.
- 作者Verbeyst, Frans; Pintelon, Rik; Rolain, Yves; Schoukens, Johan; Clement, Tracy S.
- 文件大小854.45KB
- 发表时间2007
- DOI10.1109/imtc.2007.379250
- 页码1-6