[IEEE 2007 IEEE 20th International Vacuum Nanoelectronics Conference - Chicago, IL, USA (2007.07.8-2007.07.12)] 2007 IEEE 20th International Vacuum Nanoelectronics Conference - 640×480 pixel active-matrix HEED imaging sensor with HARP target
- 作者Negishi, N.; Sato, T.; Matsuba, Y.; Tanaka, R.; Nakada, T.; Sakemura, K.; Okuda, Y.; Watanabe, A.; Yoshikawa, T.; Ogasawara, K.; Nanba, M.; Okazaki, S.; Tanioka, K.; Egami, N.; Koshida, N.
- 文件大小801.21KB
- 发表时间2007
- DOI10.1109/ivnc.2007.4480935
- 页码68-69
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