Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography
- 期刊名称Applied Physics Letters
- 作者Yan, Hanfei; Murray, Conal E.; Noyan, I. C.
- 卷第90卷
- 期第9期
- 印刷ISSN0003-6951
- 文件大小425.21KB
- 发表时间2007
- DOI10.1063/1.2711189
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