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Nucleation of HfO[sub 2] atomic layer deposition films on chemical oxide and H-terminated Si

Nucleation of HfO[sub 2] atomic layer deposition films on chemical oxide and H-terminated Si

Hackley, Justin C.; Gougousi, Theodosia; Demaree, J. Derek
  • 期刊名称Journal of Applied Physics
  • 作者Hackley, Justin C.; Gougousi, Theodosia; Demaree, J. Derek
  • 卷第102卷
  • 期第3期
  • 印刷ISSN0021-8979
  • 文件大小1024.03KB
  • 发表时间2007
  • DOI10.1063/1.2764223
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