Nucleation of HfO[sub 2] atomic layer deposition films on chemical oxide and H-terminated Si
Hackley, Justin C.; Gougousi, Theodosia; Demaree, J. Derek
- 期刊名称Journal of Applied Physics
- 作者Hackley, Justin C.; Gougousi, Theodosia; Demaree, J. Derek
- 卷第102卷
- 期第3期
- 印刷ISSN0021-8979
- 文件大小1024.03KB
- 发表时间2007
- DOI10.1063/1.2764223