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[IEEE 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Plano, TX, USA (2007.11.14-2007.11.16)] 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Combining Software Quality Analysis with Dynamic Event/Fault Trees for High Assurance Systems Engineering

[IEEE 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Plano, TX, USA (2007.11.14-2007.11.16)] 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Combining Software Quality Analysis with Dynamic Event/Fault Trees for High Assurance Systems Engineering

Dugan, Joanne Bechta; Pai, Ganesh J.; Xu, Hong

作者Dugan, Joanne Bechta; Pai, Ganesh J.; Xu, Hong
文件大小729.67KB
发表时间2007
DOI10.1109/hase.2007.73
页码245-255

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