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[IEEE The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Trollhattan, Sweden (2007.11.5-2007.11.9)] The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Using In-Process Testing Metrics to Estimate Post-Release Field Quality

[IEEE The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Trollhattan, Sweden (2007.11.5-2007.11.9)] The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Using In-Process Testing Metrics to Estimate Post-Release Field Quality

Nagappan, Nachiappan; Williams, Laurie; Vouk, Mladen; Osborne, Jason

作者Nagappan, Nachiappan; Williams, Laurie; Vouk, Mladen; Osborne, Jason
文件大小151.36KB
发表时间2007
DOI10.1109/issre.2007.18
页码209-214

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