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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Layout technique to alleviate soft failure for short pitch multi finger ESD protection devices

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Layout technique to alleviate soft failure for short pitch multi finger ESD protection devices

Mototsugu Okushima, ; Tsutomu Shinzaw, ; Yasuyuki Morishita,

作者Mototsugu Okushima, ; Tsutomu Shinzaw, ; Yasuyuki Morishita,
文件大小2791.93KB
发表时间2007
DOI10.1109/eosesd.2007.4401729

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