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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - A Programmable Window Comparator for Analog Online Testing

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - A Programmable Window Comparator for Analog Online Testing

Laknaur, Amit; Xiao, Rui; Wang, Haibo
  • 作者Laknaur, Amit; Xiao, Rui; Wang, Haibo
  • 文件大小381.08KB
  • 发表时间2007
  • DOI10.1109/vts.2007.8
  • 页码119-124
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