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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis

Bose, Soumitra; Agrawal, Vishwani D.

作者Bose, Soumitra; Agrawal, Vishwani D.
文件大小244.51KB
发表时间2007
DOI10.1109/test.2007.4437635
页码1-10

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