[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Automatic Generation of Functional Coverage Models from Behavioral Verilog Descriptions
Verma, Shireesh; Harris, Ian G.; Ramineni, Kiran
作者Verma, Shireesh; Harris, Ian G.; Ramineni, Kiran