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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - <title>Experimental validation of 20nm sensitivity of singular beam microscopy</title>

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Experimental validation of 20nm sensitivity of singular beam microscopy

Spektor, Boris; Normatov, Alexander; Shamir, Joseph; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.
  • 作者Spektor, Boris; Normatov, Alexander; Shamir, Joseph; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.
  • 卷第6616卷
  • 印刷ISSN0277-786X
  • 文件大小223.11KB
  • 发表时间2007
  • DOI10.1117/12.728539
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