[ECS 22nd Symposium on Microelectronics Technology and Devices - Rio De Janiero, Brasil (September 3 - September 6, 2007)] ECS Transactions - Electromigration Modeling for Interconnect Structures in Microelectronics
- 作者Ceric, H.; Selberherr, S.
- 卷第9卷
- 文件大小823.22KB
- 发表时间2007
- DOI10.1149/1.2766900
- 页码295-304
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