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Segmentation of defects from radiography images by the histogram concavity threshold method

Segmentation of defects from radiography images by the histogram concavity threshold method

Saravanan, T; Bagavathiappan, S; Philip, John; Jayakumar, T; Raj, Baldev

期刊名称Insight - Non-Destructive Testing and Condition Monitoring
作者Saravanan, T; Bagavathiappan, S; Philip, John; Jayakumar, T; Raj, Baldev
卷第49卷
期第10期
印刷ISSN1354-2575
文件大小585.47KB
发表时间2007-10
DOI10.1784/insi.2007.49.10.578
页码578-584

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