Mechanics of microelectronics structures as revealed by X-ray diffraction
- 期刊名称Powder Diffraction
- 作者Murray, Conal E.; Yan, H.; Noyan, I. C.
- 卷第22卷
- 期第2期
- 印刷ISSN0885-7156
- 电子ISSN1945-7413
- 文件大小374.29KB
- 发表时间2007-6
- DOI10.1154/1.2737460
- 页码98-102
同期刊推荐
A Rietveld tutorial—MulliteKaduk, James A. · Powder Diffraction · 2009
Getting the hot structuresKelton, K. F.; Gangopadhyay, A. K. · Powder Diffraction · 2005
Microdiffraction using two-dimensional detectorsHe, Bob Baoping · Powder Diffraction · 2004
Initial Rietveld characterisation of biological calcificationsRogers, K. D. · Powder Diffraction · 1997
Towards Improved Alignment of Powder DiffractometersSchreiner, Walter N. · Powder Diffraction · 1986
Frank McClune, an ICDD LegendBlanton, Tom · Powder Diffraction · 2014
Permanent Samples for Guinier CamerasSperling, Z. · Powder Diffraction · 1991
Indexing crystal facesPrigodich, R. V.; Zager, M. · Powder Diffraction · 1995