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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Scheduling for Memory Cores with Built-In Self-Repair

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Scheduling for Memory Cores with Built-In Self-Repair

Yoneda, Tomokazu; Fukuda, Yuusuke; Fujiwara, Hideo

作者Yoneda, Tomokazu; Fukuda, Yuusuke; Fujiwara, Hideo
文件大小303.57KB
发表时间2007
DOI10.1109/ats.2007.4388009
页码199-206

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