SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on magnetic intensity test based on light speed modulating with inner interfering
Li, Yanmin; Pan, Junhua; Wyant, James C.; Li, Mengchao; Zheng, Gang; Wang, Hexin; Zhuang, Songlin
- 作者Li, Yanmin; Pan, Junhua; Wyant, James C.; Li, Mengchao; Zheng, Gang; Wang, Hexin; Zhuang, Songlin
- 卷第6723卷
- 印刷ISSN0277-786X
- 文件大小592.51KB
- 发表时间2007
- DOI10.1117/12.783211