SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - A novel low-cost high-throughput probe card scanner analyzer for characterization of magnetic tunnel junctions
- 作者Pong, Philip W. T.; Postek, Michael T.; Allgair, John A.; Schmoueli, Moshe; Marcus, Eliezer; Egelhoff, Jr., William F.
- 卷第6648卷
- 印刷ISSN0277-786X
- 文件大小851.41KB
- 发表时间2007
- DOI10.1117/12.731143
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SPIE Proceedings [SPIE 27th International congress on High-Speed Photography and Photonics - Xi'an, China (Sunday 17 September 2006)] 27th International Congress on High-Speed Photography and Photonics - A femtosecond electron diffraction systemZhao, Baosheng; Hou, Xun; Zhao, Wei; Zhang, Jie; Tian, Jinshou; Yao, Baoli; Wang, Junfeng; Wu, Jianjun; Liu, Yunquan; Liu, Hulin · 2006