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Lifetime and leakage current considerations in metal-doped germanium

Lifetime and leakage current considerations in metal-doped germanium

E. Simoen; C. Claeys; S. Sioncke; J. Van Steenbergen; M. Meuris; S. Forment; J. Vanhellemont; P. Clauws; A. Theuwis
  • 作者E. Simoen; C. Claeys; S. Sioncke; J. Van Steenbergen; M. Meuris; S. Forment; J. Vanhellemont; P. Clauws; A. Theuwis
  • 卷第18卷
  • 期第7期
  • 印刷ISSN0957-4522
  • 电子ISSN1573-482X
  • 文件大小248.41KB
  • 发表时间2007-07
  • DOI10.1007/s10854-006-9110-7
  • 页码799-804
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