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Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs

Ciaran J. Brennan; Kiran Chatty; Jeff Sloan; Paul Dunn; Mujahid Muhammad; Robert Gauthier

作者Ciaran J. Brennan; Kiran Chatty; Jeff Sloan; Paul Dunn; Mujahid Muhammad; Robert Gauthier
卷第47卷
期第7期
印刷ISSN0026-2714
文件大小355.34KB
发表时间2007
DOI10.1016/j.microrel.2006.11.008
页码1069-1073