海量图书期刊资源，随时随地畅享阅读乐趣
Performance, reliability, radiation effects, and aging issues in microelectronics – From atomic-scale physics to engineering-level modelingSokrates T. Pantelides; L. Tsetseris; M.J. Beck; S.N. Rashkeev; G. Hadjisavvas; I.G. Batyrev; B.R. Tuttle; A.G. Marinopoulos; X.J. Zhou; D.M. Fleetwood; R.D. Schrimpf · 2010