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Defects in electronics and their significance for structural integrity

Defects in electronics and their significance for structural integrity

W. J. PLUMBRIDGE

作者W. J. PLUMBRIDGE
卷第30卷
期第5期
印刷ISSN8756-758X
电子ISSN1460-2695
文件大小545.22KB
发表时间2007
DOI10.1111/j.1460-2695.2006.01060.x
页码432-442

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