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A machine vision system for automated non-invasive assessment of cell viability via dark field microscopy, wavelet feature selection and classification

A machine vision system for automated non-invasive assessment of cell viability via dark field microscopy, wavelet feature selection and classification

Ning Wei; Erwin Flaschel; Karl Friehs; Tim Wilhelm Nattkemper

作者Ning Wei; Erwin Flaschel; Karl Friehs; Tim Wilhelm Nattkemper
卷第9卷
期第1期
印刷ISSN1471-2105
文件大小826.68KB
发表时间2008-12
DOI10.1186/1471-2105-9-449

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