![[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Hierarchical current density verification for electromigration analysis in arbitrarily shaped metallization patterns of analog circuits]()
[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Hierarchical current density verification for electromigration analysis in arbitrarily shaped metallization patterns of analog circuitsJerke, G.; Lienig, J. · 2002