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[IEEE 2008 13th International Power Electronics and Motion Control Conference (EPE/PEMC 2008) - Poznan, Poland (2008.09.1-2008.09.3)] 2008 13th International Power Electronics and Motion Control Conference - Measurement of temperature sensitive parameter characteristics of semiconductor silicon and silicon -carbide power devices

[IEEE 2008 13th International Power Electronics and Motion Control Conference (EPE/PEMC 2008) - Poznan, Poland (2008.09.1-2008.09.3)] 2008 13th International Power Electronics and Motion Control Conference - Measurement of temperature sensitive parameter characteristics of semiconductor silicon and silicon -carbide power devices

Nowak, Mietek; Rabkowski, Jacek; Barlik, Roman
  • 作者Nowak, Mietek; Rabkowski, Jacek; Barlik, Roman
  • 文件大小498.44KB
  • 发表时间2008
  • DOI10.1109/EPEPEMC.2008.4635248
  • 页码84-87
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