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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme

Kim, Taejin; Chun, Sunghoon; Kim, Yongjoon; Yang, Myung-Hoon; Kang, Sungho

作者Kim, Taejin; Chun, Sunghoon; Kim, Yongjoon; Yang, Myung-Hoon; Kang, Sungho
文件大小363.20KB
发表时间2008
DOI10.1109/ATS.2008.58
页码151-156

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