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[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Three Subthreshold Flip-Flop Cells Characterized in 90 nm and 65 nm CMOS Technology

[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Three Subthreshold Flip-Flop Cells Characterized in 90 nm and 65 nm CMOS Technology

Alstad, Havard Pedersen; Aunet, Snorre

作者Alstad, Havard Pedersen; Aunet, Snorre
文件大小3531.73KB
发表时间2008
DOI10.1109/ddecs.2008.4538745
页码1-4

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