Transmission Gates Combined With Level-Restoring CMOS Gates Reduce Glitches in Low-Power Low-Frequency Multipliers
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Carbognani, Flavio; Buergin, Felix; Felber, Norbert; Kaeslin, Hubert; Fichtner, Wolfgang
- 卷第16卷
- 期第7期
- 印刷ISSN1063-8210
- 文件大小749.27KB
- 发表时间2008-07
- DOI10.1109/TVLSI.2008.2000457
- 页码830-836
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