[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Use of interleaving and error correction to infrared patterns for the improvement of position estimation systems
Petrellis, N.; Gioulekas, F.; Birbas, M.; Kikidis, J.; Birbas, A.
- 作者Petrellis, N.; Gioulekas, F.; Birbas, M.; Kikidis, J.; Birbas, A.
- 文件大小336.05KB
- 发表时间2008
- DOI10.1109/ETFA.2008.4638443
- 页码488-491