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[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Use of interleaving and error correction to infrared patterns for the improvement of position estimation systems

[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Use of interleaving and error correction to infrared patterns for the improvement of position estimation systems

Petrellis, N.; Gioulekas, F.; Birbas, M.; Kikidis, J.; Birbas, A.
  • 作者Petrellis, N.; Gioulekas, F.; Birbas, M.; Kikidis, J.; Birbas, A.
  • 文件大小336.05KB
  • 发表时间2008
  • DOI10.1109/ETFA.2008.4638443
  • 页码488-491
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