[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Peculiarities Characteristics Between Contact Trace and Contact Resistance of Tin Plated Contacts
Tamai, Terutaka; Saitoh, Yasushi; Sawada, Shigeru; Hattori, Yasuhiro
- 作者Tamai, Terutaka; Saitoh, Yasushi; Sawada, Shigeru; Hattori, Yasuhiro
- 文件大小3816.89KB
- 发表时间2008
- DOI10.1109/holm.2008.ecp.65
- 页码337-343