发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - A study into the sequencing of thermal cycling and vibration tests

[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - A study into the sequencing of thermal cycling and vibration tests

Perkins, Andy; Sitaraman, Suresh K.

作者Perkins, Andy; Sitaraman, Suresh K.
文件大小1039.03KB
发表时间2008
DOI10.1109/ECTC.2008.4550032
页码584-592

← 返回【学霸图书馆】主页