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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A Low-Cost Accumulator-Based Test Pattern Generation Architecture

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A Low-Cost Accumulator-Based Test Pattern Generation Architecture

Magos, Dimitrios; Voyiatzis, Ioannis; Tarnick, Steffen

作者Magos, Dimitrios; Voyiatzis, Ioannis; Tarnick, Steffen
文件大小348.19KB
发表时间2008
DOI10.1109/IOLTS.2008.54
页码267-272

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