[IEEE 2008 IEEE International Frequency Control Symposium - Honolulu, HI (2008.05.19-2008.05.21)] 2008 IEEE International Frequency Control Symposium - Determination of the crystalline quality of the piezoelectric materials of class 32 using X-Ray topography
- 作者Capelle, B.; Detaint, J.; Epelboin, Y.
- 文件大小1292.65KB
- 发表时间2008
- DOI10.1109/freq.2008.4622993
- 页码219-224
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