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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Guard Ring Interactions and their Effect on CMOS Latchup Resilience

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Guard Ring Interactions and their Effect on CMOS Latchup Resilience

Farbiz, Farzan; Rosenbaum, Elyse

作者Farbiz, Farzan; Rosenbaum, Elyse
文件大小294.31KB
发表时间2008
DOI10.1109/iedm.2008.4796690
页码1-4

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