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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Beyond 10 Gbps? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment

Moreira, J.; Barnes, H.; Kaga, H.; Comai, M.; Roth, B.; Culver, M.

作者Moreira, J.; Barnes, H.; Kaga, H.; Comai, M.; Roth, B.; Culver, M.
文件大小5760.48KB
发表时间2008
DOI10.1109/test.2008.4700651
页码1-10

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