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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips

Zajac, Piotr; Collet, Jacques H.; Napieralski, Andrzej

作者Zajac, Piotr; Collet, Jacques H.; Napieralski, Andrzej
文件大小298.91KB
发表时间2008
DOI10.1109/iolts.2008.58
页码219-224

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