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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - FIT numerical modeling for EMI Discovery and #x201C;Design#x201D;

[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - FIT numerical modeling for EMI Discovery and #x201C;Design#x201D;

Drewniak, J.

作者Drewniak, J.
文件大小1555.37KB
发表时间2008
DOI10.1109/isemc.2008.4652229
页码1-11

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