Radiation hardness properties of full-3D active edge silicon sensors
- 作者C. Da Viá; J. Hasi; C. Kenney; V. Linhart; Sherwood Parker; T. Slavicek; S.J. Watts; P. Bem; T. Horazdovsky; S. Pospisil
- 卷第587卷
- 印刷ISSN0168-9002
- 文件大小474.30KB
- 发表时间2008
- DOI10.1016/j.nima.2007.12.027
- 页码243-249
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