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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers

Erdogan, Erdem Serkan; Ozev, Sule

作者Erdogan, Erdem Serkan; Ozev, Sule
文件大小305.00KB
发表时间2008
DOI10.1109/vts.2008.39
页码209-214

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