[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Investigation of electrostatic integrity for ultra-thin-body GeOI MOSFET using analytical solution of poisson’s equation
- 作者Vita Pi-Ho Hu, ; Yu-Sheng Wu, ; Pin Su,
- 文件大小524.71KB
- 发表时间2008
- DOI10.1109/edssc.2008.4760684
- 页码1-4