[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Optimal Backgrounds Selection for Multi Run Memory Testing
- 作者Mrozek, Ireneusz; Yarmolik, Vyacheslav
- 文件大小1629.06KB
- 发表时间2008
- DOI10.1109/ddecs.2008.4538812
- 页码1-7
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