[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot carrier degradation in nanowire (NW) FinFETs
Maiti, T. K.; Bera, M. K.; Mahato, S. S.; Chakraborty, P.; Mahata, C.; Sengupta, M.; Chakraborty, A.; Maiti, C. K.
- 作者Maiti, T. K.; Bera, M. K.; Mahato, S. S.; Chakraborty, P.; Mahata, C.; Sengupta, M.; Chakraborty, A.; Maiti, C. K.
- 文件大小232.89KB
- 发表时间2008
- DOI10.1109/ipfa.2008.4588213
- 页码1-4