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[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - A novel approach to statistical simulation of ICS affected by non-linear variabilities

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - A novel approach to statistical simulation of ICS affected by non-linear variabilities

Biagetti, Giorgio; Crippa, Paolo; Curzi, Alessandro; Orcioni, Simone; Turchetti, Claudio
  • 作者Biagetti, Giorgio; Crippa, Paolo; Curzi, Alessandro; Orcioni, Simone; Turchetti, Claudio
  • 文件大小126.04KB
  • 发表时间2008
  • DOI10.1109/iscas.2008.4542085
  • 页码2985-2988
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