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[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Microscopy Study of Fretting Corrosion Caused by the Tin Plating Thickness

[IEEE 2008 IEEE Holm Conference on Electrical Contacts (Holm 2008) - Orlando, Florida (2008.10.27-2008.10.29)] 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts - Microscopy Study of Fretting Corrosion Caused by the Tin Plating Thickness

Ito, Tetsuya; Sawada, Shigeru; Hattori, Yasuhiro; Saitoh, Yasushi; Tamai, Terutaka; Iida, Kazuo
  • 作者Ito, Tetsuya; Sawada, Shigeru; Hattori, Yasuhiro; Saitoh, Yasushi; Tamai, Terutaka; Iida, Kazuo
  • 文件大小625.99KB
  • 发表时间2008
  • DOI10.1109/holm.2008.ecp.58
  • 页码294-300
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