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Growth and ellipsometric characterizations of highly (111)-oriented Bi[sub 2]Ti[sub 2]O[sub 7] films on platinized silicon by metal organic decomposition method

Growth and ellipsometric characterizations of highly (111)-oriented Bi[sub 2]Ti[sub 2]O[sub 7] films on platinized silicon by metal organic decomposition method

Hu, Z. G.; Li, Y. W.; Zhu, M.; Yue, F. Y.; Zhu, Z. Q.; Chu, J. H.

期刊名称Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
作者Hu, Z. G.; Li, Y. W.; Zhu, M.; Yue, F. Y.; Zhu, Z. Q.; Chu, J. H.
卷第26卷
期第5期
印刷ISSN0734-2101
文件大小401.92KB
发表时间2008
DOI10.1116/1.2970142

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