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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Non-Abelian invariant feature detection

[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Non-Abelian invariant feature detection

Gur, Yaniv; Sochen, Nir

作者Gur, Yaniv; Sochen, Nir
文件大小128.29KB
发表时间2008
DOI10.1109/icpr.2008.4761230
页码1-4

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