海量图书期刊资源,随时随地畅享阅读乐趣
A coordinate frame for helical flowsT. T. Tung; R. L. Laurence · 1975
Drilling fluid shear stress overshoot behaviorR. A. Speers; K. R. Holme; M. A. Tung; W. T. Williamson · 1987
Levels of Helium by Electron ImpactAnderson, R. J.; Hughes, R. H.; Tung, J. H.; Chen, S. T. · Physical Review A · 1973
Growth of single crystal NiSi2 layers on Si (110)R. T. Tung; S. Nakahara; T. Boone · 1985
grown on Si(111)Hellman, F.; Tung, R. T. · Physical Review B · 1988
Electron transport of inhomogeneous Schottky barriersR. T. Tung · 1991
Epitaxial silicide interfaces: Fabrication and propertiesR. T. Tung · 1989
Single atom self diffusion on nickelRaymond T. Tung; William R. Graham · 1979
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992