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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Root-Finding Method for Assessing SRAM Stability

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Root-Finding Method for Assessing SRAM Stability

Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv; Liu, Frank; Nassif, Sani

作者Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv; Liu, Frank; Nassif, Sani
文件大小558.02KB
发表时间2008
DOI10.1109/isqed.2008.4479841
页码804-809

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