Sensitized erbium emission from silicon-rich nitride/silicon superlattice structures
- 期刊名称Applied Physics Letters
- 作者Dal Negro, L.; Li, R.; Warga, J.; Basu, S. N.
- 卷第92卷
- 期第18期
- 印刷ISSN0003-6951
- 文件大小552.15KB
- 发表时间2008
- DOI10.1063/1.2920435
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